Speaker's Name: Jennifer Hellrung
Topic: Using 3 Charts for SPC
Abstract: Statistical process control is a vital tool for quality professionals. Knowing which chart to use and how to use it is essential. There will be a review of the two most common charts for variable data, I/MR or X/Bar/R charts. While either I/MR or X/Bar/R charts can be used in most variable data situations, there are cases where a better choice is to use a combination of these, called the 3-chart method. This presentation will show how to apply this method and describe situations where this method would be appropriate. Several real-world applications will be shown. Attendees should leave with a clear understanding of how and when to apply the 3-chart method, which can be immediately put into practice in their work. They should also have a better sense of which variables chart type to use in a new situation. There will be plenty of opportunities for questions and discussion throughout the presentation.
Speaker's Bio: Jennifer is a quality engineering specialist with 3M Company. She has over 20 years of experience in quality and statistical consulting. Currently, she collaborates with cross-functional teams within the Company, as well as with suppliers and customers, to ensure the company’s products meet customer needs. Jennifer has taught numerous statistical and Six Sigma courses as well as implemented and taught SPC at several global sites. She has been working on process monitoring since early in her career. In addition to presenting at the Fall Technical Conference, she has also published on the use of neural networks for process monitoring and a real-time process monitoring scheme for industry. Jennifer received a B. S. in Chemical Engineering and a Master’s in Statistics from Iowa State University. She lives in the Minneapolis area with her husband and three daughters.