December 2024 ASQ Section 508 Joint Meeting with Measurement Quality Division
Hold Tuesday, December 10, 2024, for a joint meeting with the Measurement Quality Division. Dilip Shah will present “Control Charts.” The meeting will be via Webex and additional details will follow.
Description: The concept of Control (Shewhart or SPC) Charts is 100 years old. Walter Shewhart came up with the concept in 1924. Today, it is even more important as the need for precision and accuracy get even more demanding as technology improves. This presentation provides an introduction to Control Chart design concepts. Attendees will learn about creating X-Bar/Range and Individual Moving Range charts. Attendees will learn how to interpret control charts for process troubleshooting.
Learning objectives:
- Shewhart Control Chart Introduction and history
- Design of X-Bar/R and I-MR charts
- Interpreting Control Chart Data
- Troubleshooting and improving your process from Control Chart data analysis
Dilip A. Shah has over 45 years of industry experience in metrology, electronics, instrumentation, measurement and computer applications of statistics in the Quality Assurance areas. He has been employed in various positions with Philips Electronics (UK), Kodak Ltd. (UK), Instruments Division of Monsanto Corporation, Flexsys America and Alpha Technologies. He is currently a Principal of E = mc3 Solutions, a consulting practice that provides training, consulting and auditing solutions in ISO/IEC 17025, Measurement Uncertainty and its computer applications.
Dilip is the co-author of The Metrology Handbook (1st and 2nd editions) and a reviewer of the 3rd edition published by the ASQ Quality Press. Dilip is an A2LA Workplace Training instructor and conducts various workshops related to measurement uncertainty and ISO/IEC 17025 related topics.
Dilip is an ASQ Fellow and certified by American Society for Quality (ASQ) as a Certified Quality Auditor, Certified Quality Engineer and Certified Calibration Technician.