ASQ RRD Series: Analysis Of Survival Data In Engineering, Business, And Medicine
ASQ RRD Series: Analysis of Survival Data in Engineering, Business, and Medicine
Thu, Apr 8, 2021 12:00 PM – 1:00 PM EDT
Presenter: Dr. Wayne Nelson
This talk is an introduction to survival data analysis in engineering, business, and medicine. It presents basic concepts including the Weibull distribution, its age dependent failure rate, and simple probability plots. The talk shows applications to engineering, business, and medicine,, including
• The reliability of products designed and manufactured by engineers (e.g., toaster life).
• The distribution of time to a bank’s loss of bank accounts and TV service’s loss of subscribers.
• The life distribution of patients under treatment and life of medical devices (e.g., heart pacemakers).
The life distribution of patients and products, e.g., median life, % surviving 5-years or warranty.
• Whether a product failure rate increases or decreases as the population ages. This information is used to determine whether preventive replacement of old units in service reduces in-service failures.
• A prediction of the number of population failures in a coming month, quarter, or year.
During product development, a prediction of the improvement in product life that would result from eliminating one or more failure modes.
• Comparisons of 1) medical treatments, 2) business policies, and 3) product designs, vendors, materials, operating environments, manufacturing methods, etc.
SPEAKER. Dr. Wayne Nelson is an expert on reliability data analysis and accelerated testing. He worked at GE Research & Development for 24 years, and now consults privately. He is a fellow of the Amer. Society for Quality, the Institute of Electrical and Electronic Engineers, and the Amer. Statistical Assoc. ASQ awarded him the Shewhart and Shainin Medals and the Hahn Award for his lifetime achievements, and the Brumbaugh and Youden Prizes for articles on innovative methodology. He was the second person to receive the Lifetime Achievement Award of the 2,000-member IEEE Reliability Society for his innovative contributions to reliability methodology and reliability education.